The Competitive Advantage of ARIS
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100%
Cross sectional coverage without moving parts
Through thickness resonance allows for simultaneous surface and sub-surface inspection coverage of both physical (defects) and material (microstructural) properties. -
Superior
Resolution
Advanced ultrasonics supports the detection of small defects such as inclusions that would be impossible by other techniques. Meets or exceeds ASTM F2282. -
Fast
Measurement Times
A quick and non-contact technique enables in process, non-invasive inspection and can eliminate post production inspection and the use of liquid couplants required of ultrasonic systems. -
Small
Equipment Footprint
Miniaturized sensors and compact test fixtures are ideal for fast in-line installation and ease of change over or complex integration into post production inspection systems.
What Defects ARIS Detects
- Discontinuities such as cracks, seams and button defects affecting the modulus or elastic properties in the surrounding areas. Also crack precursors or abnormally high stress locations. The defect severity is indicated as a function of change in the signal response against defect
- Inclusions both hard and soft as well as porosity are detected selectively in the cross section
- Variance in material process path conditions that include; Rockwell or Vickers variance, decarb and microstructure consistency
- Insensitive to typical surface conditions, roughness and most lubricants
